Year: 2016
Type: article
Abstract: Nass et al. [IUCrJ (2016), 3, 180-191] have demonstrated that serial femtosecond crystallography (SFX) data collected at X-ray free-electron lasers (XFELs) can be successfully phased using only the weak anomalous scattering from the native S atoms.
Source: IUCrJ
Author: Quan Hao
Institution: University of Hong Kong
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,200
OpenAlex ID: W2344913368