Work

Thickness Dependence of Optical and Electrical Properties of Cu Film

Year: 2008

Type: article

Source: Ludong University Journal

Author: Qin Qing-song

Institution: Ludong University

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2350440453

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