Work

Texture defect inspection method using difference statistics feature in wavelet domain

Year: 2004

Type: article

Source: Systems engineering and electronics

Author: Chengping Zhou

Institution: Huazhong University of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2358139167

FWCI:

Cites:

Cited by: 6

Related to: 10