Work

Determine sample thickness in the process of terahertz spectrum analysis using error theory

Year: 2009

Type: article

Source: Laser & Infrared

Author: Wang Xiu-min

Institution: Beijing University of Civil Engineering and Architecture

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2370373796

FWCI:

Cites:

Cited by: 3

Related to: 10