Work

Performance characterization and mechanism analysis of InSb wafer material

Year: 2013

Type: article

Source: Laser & Infrared

Author: Gong Fen

Institution: North China Research Institute of Electro-optics

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2371613304

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