Work

The on Line Spectrum Measurement in the Preparation of Thin Film

Year: 2000

Type: article

Source: Acta Physica Sinica

Authors: Lei Liu, Jie Shen

Language: English

Topic: Advanced Materials and Semiconductor Technologies

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2375443322

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