Work

A Statistical Parametric and Probe Yield Analysis Methodology

Year: 1996

Type: article

Source: Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Author: A.Y. Wong

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2396122647

FWCI: 0.932

Cites: 4

Cited by: 21

Related to: 10