Work

Multiscale fully convolutional network with application to industrial inspection

Year: 2016

Type: conference-paper

Source: IEEE Winter Conference on Applications of Computer Vision

DOI: 10.1109/wacv.2016.7477595

Authors: Xiao Bian, Ser Nam Lim, Ning Zhou

Institutions: General Electric (United States), GE Global Research (United States)

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2404464147

FWCI: 2.252

Cites: 19

Cited by: 70

Related to: 10