Work

A power-cycling-induced failure mechanism in IGBT multichip modules

Year: 1995

Type: article

Source: OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)

Authors: P. Malberti, Mauro Ciappa, R. Cattomio

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2417351392

FWCI: 0.926

Cites:

Cited by: 11

Related to: 10