Work

Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data

Year: 2016

Type: article

Source: Journal of Testing and Evaluation

DOI: 10.1520/jte20150262

Authors: Chien-Wei Wu, Mou-Yuan Liao, Chi-Wei Lin, Tzu-Ling Lin

Institutions: National Tsing Hua University, Providence University, Feng Chia University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2432381856

FWCI: 1.256

Cites: 25

Cited by: 9

Related to: 10