Work

Passivation Effect of Atomic Layer Deposition of Al2O3 Film on HgCdTe Infrared Detectors

Year: 2016

Type: article

Source: Journal of Electronic Materials

DOI: 10.1007/s11664-016-4686-z

Authors: Peng Zhang, Zhen-Hua Ye, Chang-Hong Sun, Yi-Yu Chen, Tian-Ning Zhang, Xin Chen, Chun Lin, Ring-Jun Ding, Li He

Institutions: Chinese Academy of Sciences, Shanghai Institute of Technical Physics, University of Chinese Academy of Sciences

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2462983986

FWCI: 2.289

Cites: 22

Cited by: 44

Related to: 10