Work

Microscopic PSF estimation and resolution enhancement by speckle pattern illumination

Year: 2016

Type: conference-paper

Source: Imaging and Applied Optics

DOI: 10.1364/cosi.2016.ct1d.3

Authors: N. Meitav, E. N. Ribak, S. Shoham

Institution: Technion – Israel Institute of Technology

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2500294317

FWCI: 0.112

Cites: 5

Cited by: 1

Related to: 10