Reliability Evaluation of Direct Chip Attached Silicon Carbide
Year: 2004
Type: article
Authors: Robert S. Okojie, Ender Savrun, Phong Nguyen, Vu Nguyen, Charles Blaha
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2500492507