Work

Reliability based design optimization of wire bonding in power microelectronic devices

Year: 2016

Type: article

Source: Microsystem Technologies

DOI: 10.1007/s00542-016-3151-5

Authors: A. Makhloufi, Y. Aoues, A. El Hami

Institution: Institut National des Sciences Appliquées Rouen Normandie

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Forskningsrådet om Hälsa, Arbetsliv och Välfärd

OpenAlex ID: W2528765151

FWCI: 3.768

Cites: 24

Cited by: 57

Related to: 10