Year: 2016
Type: preprint
Abstract: Focusing of electron waves in graphene p-n junctions is a striking manifestation of fermionic negative refraction. We analyze lensing in smooth p-n junctions and find that it differs in several interesting ways from that in the previously studied sharp p-n junctions. Most importantly, while the overall negative-refraction behavior remains unchanged, the image at the focal point undergoes additional broadening due to Klein tunneling in the junction. We develop a theory of image broadening and estimate the effect for practically interesting system parameter values.
Source: arXiv (Cornell University)
Authors: Phong, Vo Tien, Kong, Jian Feng
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2529452298