Work

Element identification in organic samples utilizing a benchtop X-ray fluorescence emission tomography (XFET) system

Year: 2013

Type: conference-paper

Source: IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

DOI: 10.1109/nssmic.2013.6829026

Authors: A. Groll, J. George, P.J. La Riviére, L. J. Meng

Institutions: University of Illinois Urbana-Champaign, University of Chicago

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: University of Illinois at Urbana-Champaign

OpenAlex ID: W2542503357

FWCI:

Cites: 11

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Related to: 10