Work

On-chip cancellation of parasitic effects for dielectric permittivity measurement

Year: 2008

Type: conference-paper

Source: IEEE MTT-S International Microwave Symposium digest

DOI: 10.1109/mwsym.2008.4633317

Authors: Chunrong Song, Pingshan Wang

Institution: Clemson University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2552495147

FWCI:

Cites: 17

Cited by: 2

Related to: 10