Work

Detailed SET Measurement and Characterization of a 65 nm Bulk Technology

Year: 2016

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2016.2637935

Authors: Maximilien Glorieux, Adrian Evans, Veronique Ferlet-Cavrois, Cesar Boatella-Polo, Dan Alexandrescu, Sylvain Clerc, Gilles Gasiot, Philippe Roche

Institutions: European Space Agency, European Space Research and Technology Centre, STMicroelectronics (France)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: European Space Agency

Award: G1928926102

OpenAlex ID: W2560787762

FWCI: 2.144

Cites: 19

Cited by: 39

Related to: 10