Work

Device simulation analysis of carrier transport in In-Ga-Zn-O thin-film transistors : Influence of carrier concentration in back-channel region

Year: 2016

Type: article

Source: IEICE technical report. Speech

Authors: 大地是友, 達也戸田, 時宜松田, 睦木村, 守古田

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2561438617

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