Work

Effects of interfacial roughness on phonon transport in bilayer silicon thin films

Year: 2015

Type: article

Source: Physical Review B

DOI: 10.1103/physrevb.92.134113

Authors: Weiyu Chen, Juekuan Yang, Zhiyong Wei, Chenhan Liu, Kedong Bi, Dongyan Xu, Deyu Li, Yunfei Chen

Institutions: Southeast University, Chinese University of Hong Kong, Vanderbilt University

Language: English

Topic: Thermal properties of materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, National Natural Science Foundation of China

Awards: van der Waals mediated interaction dynamics between individual nanostructures, G5418950717

OpenAlex ID: W2564663660

FWCI: 0.676

Cites: 32

Cited by: 15

Related to: 10