Work

In-situ observation of xenon nanocrystals in aluminum under electron and ion irradiation in transmission electron microscope.

Year: 1998

Type: article

Abstract: In-situ ion irradiation in the transmission electron microscope (TEM) is one of the unique techniques to investigate the structural evolution of materials induced by particle bombardments. In spite of many efforts to get clear results from in-situ ion irradiation, the results were sometimes unclear because of physical and technical problems associated with TEM and ion beam hardwares. This paper describes a newly developed ion beam interface with an ultra-high voltage TEM (HVTEM) for in-situ observation of ion implantation of metals and alloys in atomic scale.

Source: University of North Texas Digital Library (University of North Texas)

Author: Ken’ichi Furuya

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

Funders: U.S. Department of Energy, Basic Energy Sciences, Argonne National Laboratory

Awards: G1756342139, G18202666, G2123841078

OpenAlex ID: W256501069

FWCI:

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