Integrated Stochastic and Deterministic Sensitivity Analysis: Correlating Variability of Design Parameters with Cell and Stack Performance
Year: 2016
Type: book-chapter
Source: Springer eBooks
Authors: Zhongjie He, Hua Li, Karl Erik Birgersson
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2565844635
