Work

Measurements and analysis of PLL jitter caused by digital switching noise

Year: 2001

Type: article

Source: IEEE Journal of Solid-State Circuits

DOI: 10.1109/4.933469

Author: P. Larsson

Institution: Ajou University

Language: English

Topic: Advancements in PLL and VCO Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2163854931

FWCI: 6.809

Cites: 9

Cited by: 79

Related to: 10