Work

A stochastic collocation technique for time-domain variability analysis of active circuits

Year: 2016

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps.2016.7835415

Authors: K. Guo, F. Ferranti, B. Nouri, M. Nakhla

Institutions: Carleton University, Vrije Universiteit Brussel

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2582551636

FWCI: 2.996

Cites: 16

Cited by: 8

Related to: 10