True random number generator using current difference based on a fractional stochastic model in 40-nm embedded ReRAM
Year: 2016
Type: conference-paper
Authors: Z. Wei, Y. Katoh, S. Ogasahara, Y. Yoshimoto, K. Kawai, Y. Ikeda, K. Eriguchi, K. Ohmori, S. Yoneda
Institutions: Panasonic (Japan), Kyoto University, University of Tsukuba
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2583505690