Work

Assessment of sources of error in Background Oriented Schlieren (BOS) measurements

Year: 2016

Type: article

Source: Bulletin of the American Physical Society

Authors: Lalit K. Rajendran, Bhavini Singh, Matthew Giarra, Sally P. Bane, Pavlos P. Vlachos

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2585493193

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