Work

Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

Year: 2017

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927616012642

Authors: Ty J. Prosa, David J. Larson

Institution: Cameca (United States)

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2586944999

FWCI: 3.614

Cites: 100

Cited by: 110

Related to: 10