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An IoT inspired semiconductor Reliability test system integrated with data-mining applications

Year: 2016

Type: conference-paper

Source: International Conference on Cloud Computing and Internet of Things (CCIOT)

DOI: 10.1109/cciot.2016.7868314

Authors: Tyler Junyao Tang, Andrew Chung, Atman Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang

Institutions: Semiconductor Manufacturing International (China), Shanghai Jiao Tong University

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Shanghai Jiao Tong University

OpenAlex ID: W2594258258

FWCI: 1.789

Cites: 10

Cited by: 7

Related to: 10