Work

Surface point defects on bulk oxides: atomically-resolved scanning probe microscopy

Year: 2017

Type: review

Abstract: ). Each of these three materials prefers a different type of surface point defect: oxygen vacancies, cation vacancies, and cation adatoms, respectively. The different modes of STM imaging and the promising capabilities of non-contact Atomic Force Microscopy (nc-AFM) techniques are discussed, as well as the capability of STM to manipulate single point defects.

Source: Chemical Society Reviews

DOI: 10.1039/c7cs00076f

Authors: Martin Setvín, Margareta Wagner, Michael Schmid, Gareth S. Parkinson, Ulrike Diebold

Institution: TU Wien

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Funders: Austrian Science Fund, H2020 European Research Council