Improved Metal Oxide Semiconductor Field Effect Transistor models with wide temperature range including cryogenic temperature
Year: 2017
Type: article
Authors: Siyang Liu, Xiujun Li, Chao Liu, Weifeng Sun
Institution: Southeast University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4763145850, G7095336464, G73096510
OpenAlex ID: W2600409602
