A platform for in situ Raman and stress characterizations of V2O5 cathode using MEMS device
Year: 2017
Type: article
Source: Electrochimica Acta
Authors: Hyun Jung, Konstantinos Gerasopoulos, A. Alec Talin, Reza Ghodssi
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
Awards: G2075401295, G3242851013
OpenAlex ID: W2610828668