Work

Control of defect concentrations in silicon through surface chemistry

Year: 2005

Type: article

Source: 05AIChE: 2005 AIChE Annual Meeting and Fall Showcase

Authors: Ramakrishnan Vaidyanathan, Kapil Dev, Richard D. Braatz, Edmund G. Seebauer

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2611740992

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