Work

Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals

Year: 2017

Type: article

Abstract: Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X‐ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure–transport relationships in organic semiconductor single crystals.

Source: Advanced Electronic Materials

DOI: 10.1002/aelm.201700117

Authors: Yanfei Wu, Xinglong Ren, Kathryn A. McGarry, Matthew J. Bruzek, Christopher J. Douglas, C. Daniel Frisbie

Institutions: University of Minnesota, University of Minnesota System

Language: English

Topic: Organic Electronics and Photovoltaics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

Funders: National Science Foundation, Materials Research Science and Engineering Center, Harvard University

Awards: Nanoprobing Structural and Electrostatic Complexity in Organic Semiconductor Thin Films, University of Minnesota MRSEC