Work

Evaluation of Biometric Systems: An SVM-Based Quality index

Year: 2010

Type: conference-paper

Abstract: Biometric quality assessment is an active research ﬁeld from recent years. Quality information could be used during the enrolment step and it can also be incorporated in multimodal or soft biometrics approaches. We present in this paper an SVM-based method to compute the quality of a biometric sample using two information. The ﬁrst one is based on the image quality and the second is pattern-based metrics using the SIFT keypoints extracted from the image. Experimental results on three large and signiﬁcant face databases show the efﬁciency of the proposed quality method in predicting matching performance illustrated by the Equal Error Rate (EER).

Source: HAL

Authors: El-Abed, Mohamad, Giot, Romain, Charrier, Christophe, Rosenberger, Christophe

Institution: GREYC

Language: English

Topic: Biometric Identification and Security

Subfield: Signal Processing

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2613223135

FWCI: 0.366

Cites: 24

Cited by: 1

Related to: 10