Rank Persistence
Year: 2017
Type: conference-paper
Authors: Srikrishna Karanam, Eric Lam, Richard J. Radke
Institutions: Siemens (United States), Rensselaer Polytechnic Institute
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G7282745900
OpenAlex ID: W2621383190
