Work

Analytical Model to Estimate FinFET’s ${\text I}_{\text {ON}}$ , ${\text I}_{\text{OFF}}$ , SS, and ${\rm V}_{T}$ Distribution Due to FER

Year: 2017

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2017.2709619

Authors: S. Mittal, Amita, A. S. Shekhawat, S. Ganguly, U. Ganguly

Institution: Indian Institute of Technology Bombay

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Department of Science and Technology, Ministry of Science and Technology, India

OpenAlex ID: W2622455411

FWCI: 1.008

Cites: 8

Cited by: 13

Related to: 10