Work

Reliability study of SiC-JFET including new copper, planar and silver based interconnection and joining technologies

Year: 2016

Type: article

Authors: Andre Uhlemann, Karl Weidner, G. Mitić, S. Stegmeier

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2625657451

FWCI: 0.286

Cites:

Cited by: 11

Related to: 10