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A method to minimize condenser lens-induced hysteresis effects in a JEOL JEM-3200FSC microscope to enable stable cryoEM low-dose operations

Year: 2017
Type: preprint
Abstract: Low dose imaging procedures are key for a successful cryoEM experiment (whether by electron cryotomography, single particle analysis, electron crystallography, or MicroED). We present a method to minimize magnetic hysteresis of the condenser lens system in the JEOL JEM-3200FSC transmission electron microscope (TEM) in order to maintain a stable optical axis for the beam path of low-dose imaging. The simple procedure involves independent voltage ramping of the CL1 and CL2 lenses immediately before switching to the focusing and exposure beam settings for data collection. Highlights Enables consistent horizontal beam position during low-dose mode switching Facilitates EM automated data collection for the JEOL JEM-3200FSC Improves beam stability in both TEM imaging and diffraction modes
Language: English
Open Access status: green
OpenAlex ID: W2661619201
Cites: 9
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Related to: 10