Improving Analog Switching in HfO x -Based Resistive Memory With a Thermal Enhanced Layer
Year: 2017
Type: article
Source: IEEE Electron Device Letters
Authors: Wei Wu, Huaqiang Wu, Bin Gao, Ning Deng, Shimeng Yu, He Qian
Institutions: Tsinghua University, Arizona State University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2662553141
