Work

Transition layers at the SiO2∕SiC interface

Year: 2008

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.2949081

Authors: Tsvetanka Zheleva, Aivars Lelis, Gerd Duscher, Fude Liu, Igor Levin, Mrinal Das

Institutions: DEVCOM Army Research Laboratory, North Carolina State University, National Institute of Standards and Technology, Wolfspeed, Inc. (United States)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2033907511

FWCI: 9.621

Cites: 19

Cited by: 163

Related to: 10