Work

Substrate effect temperature on Cu2ZnSnS4 thin films deposited by ultrasonic technique

Year: 2011

Type: article

Source: Journal of New Technology and Materials

Authors: Warda Daranfed, R. Fassi, A. Hafdallah, F. Ynineb, N. Attaf, M.S. Aïda, L. Hadjeris, H. Rinnert, J. Bougdira

Institutions: University Frères Mentouri Constantine 1, Larbi Ben M'hidi University of Oum El Bouaghi, Institut Jean Lamour

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2735294840

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