Work

Conduction mechanism change with transport oxide layer thickness in oxide hetero-interface diode

Year: 2017

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.4996862

Authors: Bu-il Nam, Jong Seo Park, Keon-Hee Lim, Yong-keon Ahn, Jinwon Lee, Jun-woo Park, Nam-Kwang Cho, Donggun Lee, Han-Bo-Ram Lee, Youn Sang Kim

Institutions: Seoul National University, Incheon National University, Yonsei University, Advanced Institute of Convergence Technology

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

Award: G3862022512

OpenAlex ID: W2740977423

FWCI: 0.447

Cites: 19

Cited by: 6

Related to: 10