Work

Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity

Year: 2017

Type: article

Abstract: SH Lau, Sylvia JY Lewis, Wenbing Yun, Benjamin Stripe, Janos Kirz, Alan Lyon, David Reynolds, Richard Ian Spink; Development of an X-ray Based Spectroscopy

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927617000903

Authors: SH Lau, Sylvia JY Lewis, Wenbing Yun, Benjamin Stripe, Janos Kirz, Alan Lyon, David Reynolds, Richard Ian Spink

Institution: Sigray (United States)

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2742985628

FWCI:

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