Work

Reflectance measurements in the 0.6 to 2.5 micron part of the spectrum

Year: 1966

Type: article

Source: NASA Technical Reports Server (NASA)

Authors: William A. Fischer, Reinhold Gerharz

Institution: United States Geological Survey

Language: English

Topic: Calibration and Measurement Techniques

Subfield: Aerospace Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2747290381

FWCI:

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Related to: 10