Sic Mosfetゲート容量抽出実験方法と影響因子に関する研究【jst・京大機械翻訳】
Year: 2016
Type: article
Authors: Hui Li, Liao Xinglin, Zeng Zheng, Weihua Shao, Yaogang Hu, Hong‐Wei Xiao, Haitao Liu
Language: Japanese
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2748012256
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