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破損したランク1測定からの低ランクの正半正定値行列の復元【Powered by NICT】

Year: 2017

Type: article

Source: IEEE Transactions on Signal Processing

Authors: Yuanxin Li, Sun Yue, Yuejie Chi

Language: Japanese

Topic: Sparse and Compressive Sensing Techniques

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2748918451

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