Versatile variable temperature and magnetic field scanning probe microscope for advanced material research
Year: 2017
Type: article
Abstract: We have built a variable temperature scanning probe microscope (SPM) that covers 4.6 K-180 K and up to 7 T whose SPM head fits in a 52 mm bore magnet. It features a temperature-controlled sample stage thermally well isolated from the SPM body in good thermal contact with the liquid helium bath. It has a 7-sample-holder storage carousel at liquid helium temperature for systematic studies using multiple samples and field emission targets intended for spin-polarized spectroscopic-imaging scanning tunneling microscopy (STM) study on samples with various compositions and doping conditions. The system is equipped with a UHV sample preparation chamber and mounted on a two-stage vibration isolation system made of a heavy concrete block and a granite table on pneumatic vibration isolators. A quartz resonator (qPlus)-based non-contact atomic force microscope (AFM) sensor is used for simultaneous STM/AFM operation for research on samples with highly insulating properties such as strongly underdoped cuprates and strongly correlated electron systems.
Source: Review of Scientific Instruments
DOI: 10.1063/1.4996175
Authors: Jin-Oh Jung, Seokhwan Choi, Yeonghoon Lee, Jinwoo Kim, Donghyeon Son, Jhinhwan Lee
Institution: Korea Advanced Institute of Science and Technology
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
Awards: G1442833094, G5681673340, G8860797337
OpenAlex ID: W2752068781