Work

X-ray data processing

Year: 2017
Type: review
Abstract: The method of molecular structure determination by X-ray crystallography is a little over a century old. The history is described briefly, along with developments in X-ray sources and detectors. The fundamental processes involved in measuring diffraction patterns on area detectors, i.e. autoindexing, refining crystal and detector parameters, integrating the reflections themselves and putting the resultant measurements on to a common scale are discussed, with particular reference to the most commonly used software in the field.
Language: English
Open Access status: gold
Estimated APC paid: $1,960
OpenAlex ID: W2755918057
FWCI: 0.371
Cites: 68
Cited by: 33
Related to: 10