Work

Generating Test Data Covering Multiple Paths Using Genetic Algorithm Incorporating with Reducing Input Domain

Year: 2017

Type: conference-paper

Source: Lecture notes in electrical engineering

DOI: 10.1007/978-981-10-6499-9_70

Authors: Yan Zhang, Dunwei Gong, Xiangjuan Yao, Qiang Lu

Institutions: Mudanjiang Normal University, China University of Mining and Technology

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2758474055

FWCI: 0.182

Cites: 9

Cited by: 2

Related to: 10