Work

Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair

Year: 2013

Type: article

Abstract: We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.

Source: Optics Letters

DOI: 10.1364/ol.38.001173

Authors: David T. Lloyd, Kevin O’Keeffe, Simon M. Hooker

Institution: University of Oxford

Language: English

Topic: Laser-Matter Interactions and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funders: Engineering and Physical Sciences Research Council, Science and Technology Facilities Council